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DOI: 10.4230/OASIcs.MEMICS.2010.101
URN: urn:nbn:de:0030-drops-30586
URL: http://drops.dagstuhl.de/opus/volltexte/2011/3058/

Reinbacher, Thomas ; Brauer, Jörg ; Horauer, Martin ; Steininger, Andreas ; Kowalewski, Stefan

Test-Case Generation for Embedded Binary Code Using Abstract Interpretation

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Abstract

This paper describes a framework for test-case generation for microcontroller binary programs using abstract interpretation techniques. The key idea of our approach is to derive program invariants a priori, and then use backward analysis to obtain test vectors that are executed on the target microcontroller. Due to the structure of binary code, the abstract interpretation framework is based on propositional encodings of the program semantics and SAT solving.

BibTeX - Entry

@InProceedings{reinbacher_et_al:OASIcs:2011:3058,
  author =	{Thomas Reinbacher and J{\"o}rg Brauer and Martin Horauer and Andreas Steininger and Stefan Kowalewski},
  title =	{{Test-Case Generation for Embedded Binary Code Using Abstract Interpretation}},
  booktitle =	{Sixth Doctoral Workshop on Mathematical and Engineering Methods in Computer Science (MEMICS'10) -- Selected Papers},
  pages =	{101--108},
  series =	{OpenAccess Series in Informatics (OASIcs)},
  ISBN =	{978-3-939897-22-4},
  ISSN =	{2190-6807},
  year =	{2011},
  volume =	{16},
  editor =	{Ludek Matyska and Michal Kozubek and Tom{\'a}{\v{s}} Vojnar and Pavel Zemc{\'i}k and David Antos},
  publisher =	{Schloss Dagstuhl--Leibniz-Zentrum fuer Informatik},
  address =	{Dagstuhl, Germany},
  URL =		{http://drops.dagstuhl.de/opus/volltexte/2011/3058},
  URN =		{urn:nbn:de:0030-drops-30586},
  doi =		{http://dx.doi.org/10.4230/OASIcs.MEMICS.2010.101},
  annote =	{Keywords: Test-Case Generation, Embedded Binary Code, Abstract Interpretation}
}

Keywords: Test-Case Generation, Embedded Binary Code, Abstract Interpretation
Seminar: Sixth Doctoral Workshop on Mathematical and Engineering Methods in Computer Science (MEMICS'10) -- Selected Papers
Issue date: 2011
Date of publication: 11.03.2011


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