@InProceedings{fried_et_al:LIPIcs.SAT.2023.9,
  author =	{Fried, Dror and Nadel, Alexander and Shalmon, Yogev},
  title =	{{AllSAT for Combinational Circuits}},
  booktitle =	{26th International Conference on Theory and Applications of Satisfiability Testing (SAT 2023)},
  pages =	{9:1--9:18},
  series =	{Leibniz International Proceedings in Informatics (LIPIcs)},
  ISBN =	{978-3-95977-286-0},
  ISSN =	{1868-8969},
  year =	{2023},
  volume =	{271},
  editor =	{Mahajan, Meena and Slivovsky, Friedrich},
  publisher =	{Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
  address =	{Dagstuhl, Germany},
  URL =		{https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.SAT.2023.9},
  URN =		{urn:nbn:de:0030-drops-184717},
  doi =		{10.4230/LIPIcs.SAT.2023.9},
  annote =	{Keywords: AllSAT, SAT, Circuits}
}