eng
Schloss Dagstuhl – Leibniz-Zentrum für Informatik
Leibniz International Proceedings in Informatics
1868-8969
2012-02-24
519
530
10.4230/LIPIcs.STACS.2012.519
article
Stronger Lower Bounds and Randomness-Hardness Trade-Offs Using Associated Algebraic Complexity Classes
Jansen, Maurice
Santhanam, Rahul
We associate to each Boolean language complexity class C the algebraic class a.C consisting of families of polynomials {f_n} for which the evaluation problem over the integers is in C. We prove the following lower bound and randomness-to-hardness results:
1. If polynomial identity testing (PIT) is in NSUBEXP then a.NEXP does not have poly size constant-free arithmetic circuits.
2. a.NEXP^RP does not have poly size constant-free arithmetic circuits.
3. For every fixed k, a.MA does not have arithmetic circuits of size n^k.
Items 1 and 2 strengthen two results due to (Kabanets and Impagliazzo, 2004). The third item improves a lower bound due to (Santhanam, 2009).
We consider the special case low-PIT of identity testing for (constant-free) arithmetic circuits with low formal degree, and give improved hardness-to-randomness trade-offs that apply to this case.
Combining our results for both directions of the hardness-randomness connection, we demonstrate a case where derandomization of PIT and proving lower bounds are equivalent. Namely, we show that low-PIT is in i.o-NTIME[2^{n^{o(1)}}]/n^{o(1)} if and only if there exists a family of multilinear polynomials in a.NE/lin that requires constant-free arithmetic circuits of super-polynomial size and formal degree.
https://drops.dagstuhl.de/storage/00lipics/lipics-vol014-stacs2012/LIPIcs.STACS.2012.519/LIPIcs.STACS.2012.519.pdf
Computational Complexity
Circuit Lower Bounds
Polynomial Identity Testing
Derandomization