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Test-Case Generation for Embedded Binary Code Using Abstract Interpretation Reinbacher, Thomas Brauer, Jörg Horauer, Martin Steininger, Andreas Kowalewski, Stefan Test-Case Generation Embedded Binary Code Abstract Interpretation This paper describes a framework for test-case generation for microcontroller binary programs using abstract interpretation techniques. The key idea of our approach is to derive program invariants a priori, and then use backward analysis to obtain test vectors that are executed on the target microcontroller. Due to the structure of binary code, the abstract interpretation framework is based on propositional encodings of the program semantics and SAT solving. Schloss Dagstuhl – Leibniz-Zentrum für Informatik Thomas Reinbacher and Jörg Brauer and Martin Horauer and Andreas Steininger and Stefan Kowalewski 2011 Is Part Of OASIcs, Volume 16, Sixth Doctoral Workshop on Mathematical and Engineering Methods in Computer Science (MEMICS'10) -- Selected Papers (2011) InProceedings Text doc-type:ResearchArticle publishedVersion application/pdf doi:10.4230/OASIcs.MEMICS.2010.101 urn:nbn:de:0030-drops-30586 https://drops.dagstuhl.de/entities/document/10.4230/OASIcs.MEMICS.2010.101 eng https://creativecommons.org/licenses/by-nc-nd/3.0/legalcode