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        <datestamp>2024-03-06T10:44:27Z</datestamp>
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          <dc:title>On Closeness to k-Wise Uniformity</dc:title>
          <dc:creator>O'Donnell, Ryan</dc:creator>
          <dc:creator>Zhao, Yu</dc:creator>
          <dc:subject>k-wise independence</dc:subject>
          <dc:subject>property testing</dc:subject>
          <dc:subject>Fourier analysis</dc:subject>
          <dc:subject>Boolean function</dc:subject>
          <dc:description>A probability distribution over {-1, 1}^n is (epsilon, k)-wise uniform if, roughly, it is epsilon-close to the uniform distribution when restricted to any k coordinates. We consider the problem of how far an (epsilon, k)-wise uniform distribution can be from any globally k-wise uniform distribution. We show that every (epsilon, k)-wise uniform distribution is O(n^{k/2}epsilon)-close to a k-wise uniform distribution in total variation distance. In addition, we show that this bound is optimal for all even k: we find an (epsilon, k)-wise uniform distribution that is Omega(n^{k/2}epsilon)-far from any k-wise uniform distribution in total variation distance. For k=1, we get a better upper bound of O(epsilon), which is also optimal.
One application of our closeness result is to the sample complexity of testing whether a distribution is k-wise uniform or delta-far from k-wise uniform. We give an upper bound of O(n^{k}/delta^2) (or O(log n/delta^2) when k = 1) on the required samples. We show an improved upper bound of O~(n^{k/2}/delta^2) for the special case of testing fully uniform vs. delta-far from k-wise uniform. Finally, we complement this with a matching lower bound of Omega(n/delta^2) when k = 2.
Our results improve upon the best known bounds from [Alon et al., 2007], and have simpler proofs.</dc:description>
          <dc:publisher>Schloss Dagstuhl – Leibniz-Zentrum für Informatik</dc:publisher>
          <dc:contributor>Ryan O'Donnell and Yu Zhao</dc:contributor>
          <dc:date>2018</dc:date>
          <dc:relation>Is Part Of LIPIcs, Volume 116, Approximation, Randomization, and Combinatorial Optimization. Algorithms and Techniques (APPROX/RANDOM 2018)</dc:relation>
          <dc:type>InProceedings</dc:type>
          <dc:type>Text</dc:type>
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          <dc:identifier>doi:10.4230/LIPIcs.APPROX-RANDOM.2018.54</dc:identifier>
          <dc:identifier>urn:nbn:de:0030-drops-94581</dc:identifier>
          <dc:identifier>https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.APPROX-RANDOM.2018.54</dc:identifier>
          <dc:language>eng</dc:language>
          <dc:rights>https://creativecommons.org/licenses/by/3.0/legalcode</dc:rights>
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