No. Title Author Year
1 A Largish Sum-Of-Squares Implies Circuit Hardness and Derandomization Dutta, Pranjal et al. 2021
2 Deterministic Identity Testing Paradigms for Bounded Top-Fanin Depth-4 Circuits Dutta, Pranjal et al. 2021
3 Front Matter, Table of Contents, Preface, Conference Organization Saxena, Nitin et al. 2020
4 LIPIcs, Volume 182, FSTTCS 2020, Complete Volume Saxena, Nitin et al. 2020
5 Counting Basic-Irreducible Factors Mod p^k in Deterministic Poly-Time and p-Adic Applications Dwivedi, Ashish et al. 2019
6 Algebraic Dependencies and PSPACE Algorithms in Approximative Complexity Guo, Zeyu et al. 2018
7 Towards Blackbox Identity Testing of Log-Variate Circuits Forbes, Michael A. et al. 2018
8 Algebraic Independence over Positive Characteristic: New Criterion and Applications to Locally Low Algebraic Rank Circuits Pandey, Anurag et al. 2016
9 Identity Testing for Constant-Width, and Commutative, Read-Once Oblivious ABPs Gurjar, Rohit et al. 2016
10 Integer Factoring Using Small Algebraic Dependencies Agrawal, Manindra et al. 2016
11 Deterministic Identity Testing for Sum of Read-once Oblivious Arithmetic Branching Programs Gurjar, Rohit et al. 2015
12 The Power of Depth 2 Circuits over Algebras Saha, Chandan et al. 2009
13 Diagonal Circuit Identity Testing and Lower Bounds Saxena, Nitin 2008
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