Published in: LITES, Volume 7, Issue 1 (2021): Special Issue on Embedded System Security. Leibniz Transactions on Embedded Systems, Volume 7, Issue 1
Philipp Miedl, Rehan Ahmed, and Lothar Thiele. We know what you're doing! Application detection using thermal data. In LITES, Volume 7, Issue 1 (2021): Special Issue on Embedded System Security. Leibniz Transactions on Embedded Systems, Volume 7, Issue 1, pp. 02:1-02:28, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2021)
@Article{miedl_et_al:LITES.7.1.2, author = {Miedl, Philipp and Ahmed, Rehan and Thiele, Lothar}, title = {{We know what you're doing! Application detection using thermal data}}, journal = {Leibniz Transactions on Embedded Systems}, pages = {02:1--02:28}, ISSN = {2199-2002}, year = {2021}, volume = {7}, number = {1}, publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik}, address = {Dagstuhl, Germany}, URL = {https://drops.dagstuhl.de/entities/document/10.4230/LITES.7.1.2}, doi = {10.4230/LITES.7.1.2}, annote = {Keywords: Thermal Monitoring, Side Channel, Data Leak, Sequence Labelling} }
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