Published in: LIPIcs, Volume 305, 27th International Conference on Theory and Applications of Satisfiability Testing (SAT 2024)
Dror Fried, Alexander Nadel, Roberto Sebastiani, and Yogev Shalmon. Entailing Generalization Boosts Enumeration. In 27th International Conference on Theory and Applications of Satisfiability Testing (SAT 2024). Leibniz International Proceedings in Informatics (LIPIcs), Volume 305, pp. 13:1-13:14, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2024)
@InProceedings{fried_et_al:LIPIcs.SAT.2024.13, author = {Fried, Dror and Nadel, Alexander and Sebastiani, Roberto and Shalmon, Yogev}, title = {{Entailing Generalization Boosts Enumeration}}, booktitle = {27th International Conference on Theory and Applications of Satisfiability Testing (SAT 2024)}, pages = {13:1--13:14}, series = {Leibniz International Proceedings in Informatics (LIPIcs)}, ISBN = {978-3-95977-334-8}, ISSN = {1868-8969}, year = {2024}, volume = {305}, editor = {Chakraborty, Supratik and Jiang, Jie-Hong Roland}, publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik}, address = {Dagstuhl, Germany}, URL = {https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.SAT.2024.13}, URN = {urn:nbn:de:0030-drops-205351}, doi = {10.4230/LIPIcs.SAT.2024.13}, annote = {Keywords: Generalization, Minimization, Prime Implicant, AllSAT, SAT, Circuits} }
Published in: LIPIcs, Volume 271, 26th International Conference on Theory and Applications of Satisfiability Testing (SAT 2023)
Dror Fried, Alexander Nadel, and Yogev Shalmon. AllSAT for Combinational Circuits. In 26th International Conference on Theory and Applications of Satisfiability Testing (SAT 2023). Leibniz International Proceedings in Informatics (LIPIcs), Volume 271, pp. 9:1-9:18, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2023)
@InProceedings{fried_et_al:LIPIcs.SAT.2023.9, author = {Fried, Dror and Nadel, Alexander and Shalmon, Yogev}, title = {{AllSAT for Combinational Circuits}}, booktitle = {26th International Conference on Theory and Applications of Satisfiability Testing (SAT 2023)}, pages = {9:1--9:18}, series = {Leibniz International Proceedings in Informatics (LIPIcs)}, ISBN = {978-3-95977-286-0}, ISSN = {1868-8969}, year = {2023}, volume = {271}, editor = {Mahajan, Meena and Slivovsky, Friedrich}, publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik}, address = {Dagstuhl, Germany}, URL = {https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.SAT.2023.9}, URN = {urn:nbn:de:0030-drops-184717}, doi = {10.4230/LIPIcs.SAT.2023.9}, annote = {Keywords: AllSAT, SAT, Circuits} }
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