Published in: LIPIcs, Volume 145, Approximation, Randomization, and Combinatorial Optimization. Algorithms and Techniques (APPROX/RANDOM 2019)
Prahladh Harsha, Subhash Khot, Euiwoong Lee, and Devanathan Thiruvenkatachari. Improved 3LIN Hardness via Linear Label Cover. In Approximation, Randomization, and Combinatorial Optimization. Algorithms and Techniques (APPROX/RANDOM 2019). Leibniz International Proceedings in Informatics (LIPIcs), Volume 145, pp. 9:1-9:16, Schloss Dagstuhl - Leibniz-Zentrum für Informatik (2019)
@InProceedings{harsha_et_al:LIPIcs.APPROX-RANDOM.2019.9, author = {Harsha, Prahladh and Khot, Subhash and Lee, Euiwoong and Thiruvenkatachari, Devanathan}, title = {{Improved 3LIN Hardness via Linear Label Cover}}, booktitle = {Approximation, Randomization, and Combinatorial Optimization. Algorithms and Techniques (APPROX/RANDOM 2019)}, pages = {9:1--9:16}, series = {Leibniz International Proceedings in Informatics (LIPIcs)}, ISBN = {978-3-95977-125-2}, ISSN = {1868-8969}, year = {2019}, volume = {145}, editor = {Achlioptas, Dimitris and V\'{e}gh, L\'{a}szl\'{o} A.}, publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik}, address = {Dagstuhl, Germany}, URL = {https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.APPROX-RANDOM.2019.9}, URN = {urn:nbn:de:0030-drops-112245}, doi = {10.4230/LIPIcs.APPROX-RANDOM.2019.9}, annote = {Keywords: probabilistically checkable proofs, PCP, composition, 3LIN, low soundness error} }
Published in: LIPIcs, Volume 93, 37th IARCS Annual Conference on Foundations of Software Technology and Theoretical Computer Science (FSTTCS 2017)
Amey Bhangale, Subhash Khot, and Devanathan Thiruvenkatachari. An Improved Dictatorship Test with Perfect Completeness. In 37th IARCS Annual Conference on Foundations of Software Technology and Theoretical Computer Science (FSTTCS 2017). Leibniz International Proceedings in Informatics (LIPIcs), Volume 93, pp. 15:1-15:23, Schloss Dagstuhl - Leibniz-Zentrum für Informatik (2018)
@InProceedings{bhangale_et_al:LIPIcs.FSTTCS.2017.15, author = {Bhangale, Amey and Khot, Subhash and Thiruvenkatachari, Devanathan}, title = {{An Improved Dictatorship Test with Perfect Completeness}}, booktitle = {37th IARCS Annual Conference on Foundations of Software Technology and Theoretical Computer Science (FSTTCS 2017)}, pages = {15:1--15:23}, series = {Leibniz International Proceedings in Informatics (LIPIcs)}, ISBN = {978-3-95977-055-2}, ISSN = {1868-8969}, year = {2018}, volume = {93}, editor = {Lokam, Satya and Ramanujam, R.}, publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik}, address = {Dagstuhl, Germany}, URL = {https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.FSTTCS.2017.15}, URN = {urn:nbn:de:0030-drops-83854}, doi = {10.4230/LIPIcs.FSTTCS.2017.15}, annote = {Keywords: Property Testing, Distatorship Test, Fourier Analysis} }
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