BibTeX Export for Deterministic Identity Testing Paradigms for Bounded Top-Fanin Depth-4 Circuits

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@InProceedings{dutta_et_al:LIPIcs.CCC.2021.11,
  author =	{Dutta, Pranjal and Dwivedi, Prateek and Saxena, Nitin},
  title =	{{Deterministic Identity Testing Paradigms for Bounded Top-Fanin Depth-4 Circuits}},
  booktitle =	{36th Computational Complexity Conference (CCC 2021)},
  pages =	{11:1--11:27},
  series =	{Leibniz International Proceedings in Informatics (LIPIcs)},
  ISBN =	{978-3-95977-193-1},
  ISSN =	{1868-8969},
  year =	{2021},
  volume =	{200},
  editor =	{Kabanets, Valentine},
  publisher =	{Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
  address =	{Dagstuhl, Germany},
  URL =		{https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.CCC.2021.11},
  URN =		{urn:nbn:de:0030-drops-142857},
  doi =		{10.4230/LIPIcs.CCC.2021.11},
  annote =	{Keywords: Polynomial identity testing, hitting set, depth-4 circuits}
}

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