BibTeX Export for Efficiently Testable Circuits

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@InProceedings{baig_et_al:LIPIcs.ITCS.2023.10,
  author =	{Baig, Mirza Ahad and Chakraborty, Suvradip and Dziembowski, Stefan and Ga{\l}\k{a}zka, Ma{\l}gorzata and Lizurej, Tomasz and Pietrzak, Krzysztof},
  title =	{{Efficiently Testable Circuits}},
  booktitle =	{14th Innovations in Theoretical Computer Science Conference (ITCS 2023)},
  pages =	{10:1--10:23},
  series =	{Leibniz International Proceedings in Informatics (LIPIcs)},
  ISBN =	{978-3-95977-263-1},
  ISSN =	{1868-8969},
  year =	{2023},
  volume =	{251},
  editor =	{Tauman Kalai, Yael},
  publisher =	{Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
  address =	{Dagstuhl, Germany},
  URL =		{https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.ITCS.2023.10},
  URN =		{urn:nbn:de:0030-drops-175130},
  doi =		{10.4230/LIPIcs.ITCS.2023.10},
  annote =	{Keywords: circuit compilers, circuit integrity, circuit testing}
}

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