Testing Properties of Multiple Distributions with Few Samples

Authors Maryam Aliakbarpour, Sandeep Silwal



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Author Details

Maryam Aliakbarpour
  • Massachusetts Institute of Technology, Cambridge, MA 02139, USA
Sandeep Silwal
  • Massachusetts Institute of Technology, Cambridge, MA 02139, USA

Acknowledgements

The authors would like to thank Sushruth Reddy, Rikhav Shah, and Greg Valiant for helpful discussions about de Finetti’s theorem. The authors would also like to thank Ronitt Rubinfeld for valuable feedback.

Cite AsGet BibTex

Maryam Aliakbarpour and Sandeep Silwal. Testing Properties of Multiple Distributions with Few Samples. In 11th Innovations in Theoretical Computer Science Conference (ITCS 2020). Leibniz International Proceedings in Informatics (LIPIcs), Volume 151, pp. 69:1-69:41, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2020)
https://doi.org/10.4230/LIPIcs.ITCS.2020.69

Abstract

We propose a new setting for testing properties of distributions while receiving samples from several distributions, but few samples per distribution. Given samples from s distributions, p_1, p_2, …, p_s, we design testers for the following problems: (1) Uniformity Testing: Testing whether all the p_i’s are uniform or ε-far from being uniform in ℓ_1-distance (2) Identity Testing: Testing whether all the p_i’s are equal to an explicitly given distribution q or ε-far from q in ℓ_1-distance, and (3) Closeness Testing: Testing whether all the p_i’s are equal to a distribution q which we have sample access to, or ε-far from q in ℓ_1-distance. By assuming an additional natural condition about the source distributions, we provide sample optimal testers for all of these problems.

Subject Classification

ACM Subject Classification
  • Mathematics of computing → Hypothesis testing and confidence interval computation
Keywords
  • Hypothesis Testing
  • Property Testing
  • Distribution Testing
  • Identity Testing
  • Closeness Testing
  • Multiple Sources

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