DagSemProc.08371.5.pdf
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Methods and Metrics for Reliability Assessment
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Dagstuhl Seminar Proceedings, Volume 8371
Series: Dagstuhl Seminar Proceedings (DagSemProc) - License:
Creative Commons Attribution 4.0 International license
- Publication Date: 2009-03-13
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Lirida Alves de Barros-Naviner, Jean-François Naviner, Denis Teixeira Franco, and Mai Correia de Vasconcelos. Methods and Metrics for Reliability Assessment. In Fault-Tolerant Distributed Algorithms on VLSI Chips. Dagstuhl Seminar Proceedings, Volume 8371, pp. 1-15, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2009)
https://doi.org/10.4230/DagSemProc.08371.5
Abstract
This paper deals with digital VLSI design aspects related to reliability. The focus is on the problem of reliability evaluation in combinational logic circuits.We present some methods for this evaluation that can be easily integrated in a tradidional design flow. Also we describe suitable metrics for performance estimation of concurrent error detection schemes.
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Keywords
- Reliability
- fault tolerance
- combinational logic
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