Moore's law has been the driving force behind the increasing computing power of today's devices which is based on shrinking feature sizes. This shrinking process makes future devices extremely susceptible to soft errors due to, e.g., external influences like environmental radiation and internal issues like stress effects, aging and process variation. For future technology nodes "Designing reliable systems from unreliable components".
@Article{fey_et_al:DagRep.2.8.57, author = {Fey, G\"{o}rschwin and Fujita, Masahiro and Miskov-Zivanov, Natasa and Roy, Kaushik and Sonza Reorda, Matteo}, title = {{Verifying Reliability (Dagstuhl Seminar 12341)}}, pages = {54--73}, journal = {Dagstuhl Reports}, ISSN = {2192-5283}, year = {2012}, volume = {2}, number = {8}, editor = {Fey, G\"{o}rschwin and Fujita, Masahiro and Miskov-Zivanov, Natasa and Roy, Kaushik and Sonza Reorda, Matteo}, publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik}, address = {Dagstuhl, Germany}, URL = {https://drops.dagstuhl.de/entities/document/10.4230/DagRep.2.8.57}, URN = {urn:nbn:de:0030-drops-37830}, doi = {10.4230/DagRep.2.8.57}, annote = {Keywords: Reliability, fault modeling, formal methods} }
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