BibTeX Export for SAT-based Automatic Test Pattern Generation

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@InProceedings{drechsler_et_al:DagSemProc.08351.6,
  author =	{Drechsler, Rolf and Eggersgl\"{u}{\ss}, Stephan and Fey, G\"{o}rschwin and Tille, Daniel},
  title =	{{SAT-based Automatic Test Pattern Generation}},
  booktitle =	{Evolutionary Test Generation},
  pages =	{1--2},
  series =	{Dagstuhl Seminar Proceedings (DagSemProc)},
  ISSN =	{1862-4405},
  year =	{2009},
  volume =	{8351},
  editor =	{Holger Schlingloff and Tanja E. J. Vos and Joachim Wegener},
  publisher =	{Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
  address =	{Dagstuhl, Germany},
  URL =		{https://drops.dagstuhl.de/entities/document/10.4230/DagSemProc.08351.6},
  URN =		{urn:nbn:de:0030-drops-20152},
  doi =		{10.4230/DagSemProc.08351.6},
  annote =	{Keywords: Circuit, ATPG, SAT, Boolean Satisfiability}
}

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