BibTeX Export for A Static Analysis for the Minimization of Voters in Fault-Tolerant Circuits

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@Article{burlyaev_et_al:LITES-v005-i001-a004,
  author =	{Burlyaev, Dmitry and Fradet, Pascal and Girault, Alain},
  title =	{{A Static Analysis for the Minimization of Voters in Fault-Tolerant Circuits}},
  journal =	{Leibniz Transactions on Embedded Systems},
  pages =	{04:1--04:26},
  ISSN =	{2199-2002},
  year =	{2018},
  volume =	{5},
  number =	{1},
  publisher =	{Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
  address =	{Dagstuhl, Germany},
  URL =		{https://drops-dev.dagstuhl.de/entities/document/10.4230/LITES-v005-i001-a004},
  doi =		{10.4230/LITES-v005-i001-a004},
  annote =	{Keywords: Digital Circuits, Fault-tolerance, Optimization, Static Analysis, Triple Modular Redundancy}
}

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