BibTeX Export for Achieving Complete Structural Test Coverage in Embedded Systems Using Trace-Based Monitoring (Short Paper)

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@InProceedings{weiss_et_al:OASIcs.DX.2024.19,
  author =	{Weiss, Alexander and Schulz, Albert and Heininger, Martin and Sachenbacher, Martin and Leucker, Martin},
  title =	{{Achieving Complete Structural Test Coverage in Embedded Systems Using Trace-Based Monitoring}},
  booktitle =	{35th International Conference on Principles of Diagnosis and Resilient Systems (DX 2024)},
  pages =	{19:1--19:12},
  series =	{Open Access Series in Informatics (OASIcs)},
  ISBN =	{978-3-95977-356-0},
  ISSN =	{2190-6807},
  year =	{2024},
  volume =	{125},
  editor =	{Pill, Ingo and Natan, Avraham and Wotawa, Franz},
  publisher =	{Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
  address =	{Dagstuhl, Germany},
  URL =		{https://drops.dagstuhl.de/entities/document/10.4230/OASIcs.DX.2024.19},
  URN =		{urn:nbn:de:0030-drops-221115},
  doi =		{10.4230/OASIcs.DX.2024.19},
  annote =	{Keywords: structural tests, integration tests, code coverage, embedded trace}
}

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