Epic Fail: Emulators Can Tolerate Polynomially Many Edge Faults for Free

Authors Greg Bodwin, Michael Dinitz, Yasamin Nazari



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Author Details

Greg Bodwin
  • University of Michigan, Ann Arbor, MI, USA
Michael Dinitz
  • Johns Hopkins University, Baltimore, MD, USA
Yasamin Nazari
  • Universität Salzburg, Austria

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Greg Bodwin, Michael Dinitz, and Yasamin Nazari. Epic Fail: Emulators Can Tolerate Polynomially Many Edge Faults for Free. In 14th Innovations in Theoretical Computer Science Conference (ITCS 2023). Leibniz International Proceedings in Informatics (LIPIcs), Volume 251, pp. 20:1-20:22, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2023) https://doi.org/10.4230/LIPIcs.ITCS.2023.20

Abstract

A t-emulator of a graph G is a graph H that approximates its pairwise shortest path distances up to multiplicative t error. We study fault tolerant t-emulators, under the model recently introduced by Bodwin, Dinitz, and Nazari [ITCS 2022] for vertex failures. In this paper we consider the version for edge failures, and show that they exhibit surprisingly different behavior.
In particular, our main result is that, for (2k-1)-emulators with k odd, we can tolerate a polynomial number of edge faults for free. For example: for any n-node input graph, we construct a 5-emulator (k = 3) on O(n^{4/3}) edges that is robust to f = O(n^{2/9}) edge faults. It is well known that Ω(n^{4/3}) edges are necessary even if the 5-emulator does not need to tolerate any faults. Thus we pay no extra cost in the size to gain this fault tolerance. We leave open the precise range of free fault tolerance for odd k, and whether a similar phenomenon can be proved for even k.

Subject Classification

ACM Subject Classification
  • Theory of computation → Sparsification and spanners
Keywords
  • Emulators
  • Fault Tolerance
  • Girth Conjecture

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References

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