Published in: LIPIcs, Volume 394, 20th International Symposium on Empirical Software Engineering and Measurement (ESEM 2026)
Vekil Bekmyradov, Thomas Bach, Alexander Berndt, Noah C. Puetz, Bartosz Bogacz, and Thomas Bartz-Beielstein. Evaluating LLM-Based Test Generation for a Large Industrial C++ Database System. A Case Study on SAP HANA. In 20th International Symposium on Empirical Software Engineering and Measurement (ESEM 2026). Leibniz International Proceedings in Informatics (LIPIcs), Volume 394, pp. 95:1-95:20, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2026)
@InProceedings{bekmyradov_et_al:LIPIcs.ESEM.2026.95,
author = {Bekmyradov, Vekil and Bach, Thomas and Berndt, Alexander and Puetz, Noah C. and Bogacz, Bartosz and Bartz-Beielstein, Thomas},
title = {{Evaluating LLM-Based Test Generation for a Large Industrial C++ Database System. A Case Study on SAP HANA}},
booktitle = {20th International Symposium on Empirical Software Engineering and Measurement (ESEM 2026)},
pages = {95:1--95:20},
series = {Leibniz International Proceedings in Informatics (LIPIcs)},
ISBN = {978-3-95977-450-5},
ISSN = {1868-8969},
year = {2026},
volume = {394},
editor = {Feldt, Robert and Paasivaara, Maria and Mendez, Daniel and Wagner, Stefan and Bar\'{o}n, Marvin Mu\~{n}oz},
publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
address = {Dagstuhl, Germany},
URL = {https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.ESEM.2026.95},
URN = {urn:nbn:de:0030-drops-280632},
doi = {10.4230/LIPIcs.ESEM.2026.95},
annote = {Keywords: LLM, Test Generation, Software Testing, Mutation Testing, DBMS}
}