Published in: LIPIcs, Volume 369, 37th Annual Symposium on Combinatorial Pattern Matching (CPM 2026)
Hideo Bannai, Yuto Fujie, Peaker Guo, Shunsuke Inenaga, Yuto Nakashima, Simon J. Puglisi, and Cristian Urbina. Sensitivity of Repetitiveness Measures to String Reversal. In 37th Annual Symposium on Combinatorial Pattern Matching (CPM 2026). Leibniz International Proceedings in Informatics (LIPIcs), Volume 369, pp. 17:1-17:18, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2026)
@InProceedings{bannai_et_al:LIPIcs.CPM.2026.17,
author = {Bannai, Hideo and Fujie, Yuto and Guo, Peaker and Inenaga, Shunsuke and Nakashima, Yuto and Puglisi, Simon J. and Urbina, Cristian},
title = {{Sensitivity of Repetitiveness Measures to String Reversal}},
booktitle = {37th Annual Symposium on Combinatorial Pattern Matching (CPM 2026)},
pages = {17:1--17:18},
series = {Leibniz International Proceedings in Informatics (LIPIcs)},
ISBN = {978-3-95977-420-8},
ISSN = {1868-8969},
year = {2026},
volume = {369},
editor = {Bille, Philip and Prezza, Nicola},
publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
address = {Dagstuhl, Germany},
URL = {https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.CPM.2026.17},
URN = {urn:nbn:de:0030-drops-259434},
doi = {10.4230/LIPIcs.CPM.2026.17},
annote = {Keywords: String reversal, Repetitiveness measures, Burrows-Wheeler transform, Lempel-Ziv parsing, Lexicographic parsings}
}