Schloss Dagstuhl - Leibniz-Zentrum fuer Informatik GmbH Schloss Dagstuhl - Leibniz-Zentrum fuer Informatik GmbH scholarly article en Drechsler, Rolf; Eggersglüß, Stephan; Fey, Görschwin; Tille, Daniel License
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URN: urn:nbn:de:0030-drops-20152

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SAT-based Automatic Test Pattern Generation



Due to the rapidly growing size of integrated circuits, there is a need for new algorithms for Automatic Test Pattern Generation (ATPG). While classical algorithms reach their limit, there have been recent advances in algorithms to solve Boolean Satisfiability (SAT). Because Boolean SAT solvers are working on Conjunctive Normal Forms (CNF), the problem has to be transformed. During transformation, relevant information about the problem might get lost and therefore is not available in the solving process. In the following we briefly motivate the problem and provide the latest developments in the field. The technique was implemented and experimental results are presented. The approach was combined with the ATPG framework of NXP Semiconductors. Significant improvements in overall performance and robustness are demonstrated.

BibTeX - Entry

  author =	{Rolf Drechsler and Stephan Eggersgl{\"u}{\"s} and G{\"o}rschwin Fey and Daniel Tille},
  title =	{SAT-based Automatic Test Pattern Generation},
  booktitle =	{Evolutionary Test Generation},
  year =	{2009},
  editor =	{Holger Schlingloff and Tanja E. J. Vos and Joachim Wegener},
  number =	{08351},
  series =	{Dagstuhl Seminar Proceedings},
  ISSN =	{1862-4405},
  publisher =	{Schloss Dagstuhl - Leibniz-Zentrum fuer Informatik, Germany},
  address =	{Dagstuhl, Germany},
  URL =		{},
  annote =	{Keywords: Circuit, ATPG, SAT, Boolean Satisfiability}

Keywords: Circuit, ATPG, SAT, Boolean Satisfiability
Seminar: 08351 - Evolutionary Test Generation
Related Scholarly Article:
Issue date: 2009
Date of publication: 2009

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