Test-Case Generation for Embedded Binary Code Using Abstract Interpretation

@InProceedings{reinbacher_et_al:OASIcs.MEMICS.2010.101,
  author =	{Reinbacher, Thomas and Brauer, J\"{o}rg and Horauer, Martin and Steininger, Andreas and Kowalewski, Stefan},
  title =	{{Test-Case Generation for Embedded Binary Code Using Abstract Interpretation}},
  booktitle =	{Sixth Doctoral Workshop on Mathematical and Engineering Methods in Computer Science (MEMICS'10) -- Selected Papers},
  pages =	{101--108},
  series =	{Open Access Series in Informatics (OASIcs)},
  ISBN =	{978-3-939897-22-4},
  ISSN =	{2190-6807},
  year =	{2011},
  volume =	{16},
  editor =	{Matyska, Ludek and Kozubek, Michal and Vojnar, Tomas and Zemcik, Pavel and Antos, David},
  publisher =	{Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
  address =	{Dagstuhl, Germany},
  URL =		{https://drops.dagstuhl.de/entities/document/10.4230/OASIcs.MEMICS.2010.101},
  URN =		{urn:nbn:de:0030-drops-30586},
  doi =		{10.4230/OASIcs.MEMICS.2010.101},
  annote =	{Keywords: Test-Case Generation, Embedded Binary Code, Abstract Interpretation}
}