OASIcs.MEMICS.2010.101.pdf
- Filesize: 446 kB
- 8 pages
Document
Test-Case Generation for Embedded Binary Code Using Abstract Interpretation
Authors
-
Part of:
Volume:
Sixth Doctoral Workshop on Mathematical and Engineering Methods in Computer Science (MEMICS'10) -- Selected Papers (MEMICS 2010)
Series: Open Access Series in Informatics (OASIcs) - License:
Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported license
- Publication Date: 2011-03-11
Cite As Get BibTex
Thomas Reinbacher, Jörg Brauer, Martin Horauer, Andreas Steininger, and Stefan Kowalewski. Test-Case Generation for Embedded Binary Code Using Abstract Interpretation. In Sixth Doctoral Workshop on Mathematical and Engineering Methods in Computer Science (MEMICS'10) -- Selected Papers. Open Access Series in Informatics (OASIcs), Volume 16, pp. 101-108, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2011)
https://doi.org/10.4230/OASIcs.MEMICS.2010.101
Abstract
This paper describes a framework for test-case generation for microcontroller binary programs using abstract interpretation techniques. The key idea of our approach is to derive program invariants a priori, and then use backward analysis to obtain test vectors that are executed on the target microcontroller. Due to the structure of binary code, the abstract interpretation framework is based on propositional encodings of the program semantics and SAT solving.
Subject Classification
Keywords
- Test-Case Generation
- Embedded Binary Code
- Abstract Interpretation
Metrics
- Access Statistics
-
Total Accesses (updated on a weekly basis)
0PDF Downloads