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Physical Modeling of Full-Field Time-Domain Optical Coherence Tomography

Authors Andrej Keksel , Georgis Bulun, Matthias Eifler , Anis Idrizovic, Jörg Seewig

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Author Details

Andrej Keksel
  • Institute for Measurement and Sensor-Technology, Technische Universität Kaiserslautern, Germany
Georgis Bulun
  • Institute for Measurement and Sensor-Technology, Technische Universität Kaiserslautern, Germany
Matthias Eifler
  • Institute for Measurement and Sensor-Technology, Technische Universität Kaiserslautern, Germany
Anis Idrizovic
  • The Institute of Optics, University of Rochester, NY, USA
Jörg Seewig
  • Institute for Measurement and Sensor-Technology, Technische Universität Kaiserslautern, Germany

Funding

This research is funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) – 252408385 – IRTG 2057.

Cite AsGet BibTex

Andrej Keksel, Georgis Bulun, Matthias Eifler, Anis Idrizovic, and Jörg Seewig. Physical Modeling of Full-Field Time-Domain Optical Coherence Tomography. In 2nd International Conference of the DFG International Research Training Group 2057 – Physical Modeling for Virtual Manufacturing (iPMVM 2020). Open Access Series in Informatics (OASIcs), Volume 89, pp. 14:1-14:22, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2021)
https://doi.org/10.4230/OASIcs.iPMVM.2020.14

Abstract

In this paper, a physical model of full-field time-domain optical coherence tomography (FF-TD OCT), which focuses the requirements of measuring inner textures of flexible layered samples in industrial applications, is developed and validated by reference measurements. Both the operating principle and the overall design of a FF-TD OCT correspond to that of classical white light interferometry (WLI), commonly used for the measurement of areal micro-topographies. The presented model accounts for optical and geometrical properties of the system, multiple scattering of light in turbid media and interference of partially coherent light. Applying this model, virtual measurements are used to exemplarily investigate the extent to which the principles of classical WLI can be directly transferred to obtain layer thickness measurements by simulating the use of a simple low-cost WLI system as OCT. Results indicate that a currently existing instrument setup can only be used as OCT to a very limited extent but not in general due to its initial design as a WLI.

Subject Classification

ACM Subject Classification
  • Computing methodologies → Modeling methodologies
Keywords
  • Optical coherence tomography
  • full-field time-domain OCT
  • virtual measuring
  • optical measurement technology
  • physical modeling

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