Published in: Dagstuhl Seminar Proceedings, Volume 5451, Beyond Program Slicing (2006)
Sue Black, Steve Counsell, Tracy Hall, and Paul Wernick. Using Program Slicing to Identify Faults in Software. In Beyond Program Slicing. Dagstuhl Seminar Proceedings, Volume 5451, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2006)
@InProceedings{black_et_al:DagSemProc.05451.11, author = {Black, Sue and Counsell, Steve and Hall, Tracy and Wernick, Paul}, title = {{Using Program Slicing to Identify Faults in Software}}, booktitle = {Beyond Program Slicing}, series = {Dagstuhl Seminar Proceedings (DagSemProc)}, ISSN = {1862-4405}, year = {2006}, volume = {5451}, editor = {David W. Binkley and Mark Harman and Jens Krinke}, publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik}, address = {Dagstuhl, Germany}, URL = {https://drops.dagstuhl.de/entities/document/10.4230/DagSemProc.05451.11}, URN = {urn:nbn:de:0030-drops-5873}, doi = {10.4230/DagSemProc.05451.11}, annote = {Keywords: Program slicing, slicing metrics, fault proneness, software quality} }
Published in: Dagstuhl Seminar Proceedings, Volume 5451, Beyond Program Slicing (2006)
Sue Black and Philipp Bouillon. And Now For Something Completely Different.... In Beyond Program Slicing. Dagstuhl Seminar Proceedings, Volume 5451, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2006)
@InProceedings{black_et_al:DagSemProc.05451.4, author = {Black, Sue and Bouillon, Philipp}, title = {{And Now For Something Completely Different...}}, booktitle = {Beyond Program Slicing}, series = {Dagstuhl Seminar Proceedings (DagSemProc)}, ISSN = {1862-4405}, year = {2006}, volume = {5451}, editor = {David W. Binkley and Mark Harman and Jens Krinke}, publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik}, address = {Dagstuhl, Germany}, URL = {https://drops.dagstuhl.de/entities/document/10.4230/DagSemProc.05451.4}, URN = {urn:nbn:de:0030-drops-5833}, doi = {10.4230/DagSemProc.05451.4}, annote = {Keywords: Group experiment, program comprehension, source code, dynamic trace, control flow graph} }
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