Published in: LIPIcs, Volume 200, 36th Computational Complexity Conference (CCC 2021)
Pranjal Dutta, Prateek Dwivedi, and Nitin Saxena. Deterministic Identity Testing Paradigms for Bounded Top-Fanin Depth-4 Circuits. In 36th Computational Complexity Conference (CCC 2021). Leibniz International Proceedings in Informatics (LIPIcs), Volume 200, pp. 11:1-11:27, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2021)
@InProceedings{dutta_et_al:LIPIcs.CCC.2021.11, author = {Dutta, Pranjal and Dwivedi, Prateek and Saxena, Nitin}, title = {{Deterministic Identity Testing Paradigms for Bounded Top-Fanin Depth-4 Circuits}}, booktitle = {36th Computational Complexity Conference (CCC 2021)}, pages = {11:1--11:27}, series = {Leibniz International Proceedings in Informatics (LIPIcs)}, ISBN = {978-3-95977-193-1}, ISSN = {1868-8969}, year = {2021}, volume = {200}, editor = {Kabanets, Valentine}, publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik}, address = {Dagstuhl, Germany}, URL = {https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.CCC.2021.11}, URN = {urn:nbn:de:0030-drops-142857}, doi = {10.4230/LIPIcs.CCC.2021.11}, annote = {Keywords: Polynomial identity testing, hitting set, depth-4 circuits} }
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