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Verifying Reliability (Dagstuhl Seminar 12341)

Authors: Görschwin Fey, Masahiro Fujita, Natasa Miskov-Zivanov, Kaushik Roy, and Matteo Sonza Reorda

Published in: Dagstuhl Reports, Volume 2, Issue 8 (2013)

Abstract

Moore's law has been the driving force behind the increasing computing power of today's devices which is based on shrinking feature sizes. This shrinking process makes future devices extremely susceptible to soft errors due to, e.g., external influences like environmental radiation and internal issues like stress effects, aging and process variation. For future technology nodes "Designing reliable systems from unreliable components".

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Görschwin Fey, Masahiro Fujita, Natasa Miskov-Zivanov, Kaushik Roy, and Matteo Sonza Reorda. Verifying Reliability (Dagstuhl Seminar 12341). In Dagstuhl Reports, Volume 2, Issue 8, pp. 54-73, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2012)

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@Article{fey_et_al:DagRep.2.8.57,
  author =	{Fey, G\"{o}rschwin and Fujita, Masahiro and Miskov-Zivanov, Natasa and Roy, Kaushik and Sonza Reorda, Matteo},
  title =	{{Verifying Reliability (Dagstuhl Seminar 12341)}},
  pages =	{54--73},
  journal =	{Dagstuhl Reports},
  ISSN =	{2192-5283},
  year =	{2012},
  volume =	{2},
  number =	{8},
  editor =	{Fey, G\"{o}rschwin and Fujita, Masahiro and Miskov-Zivanov, Natasa and Roy, Kaushik and Sonza Reorda, Matteo},
  publisher =	{Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
  address =	{Dagstuhl, Germany},
  URL =		{https://drops.dagstuhl.de/entities/document/10.4230/DagRep.2.8.57},
  URN =		{urn:nbn:de:0030-drops-37830},
  doi =		{10.4230/DagRep.2.8.57},
  annote =	{Keywords: Reliability, fault modeling, formal methods}
}

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DOI: 10.4230/DagSemProc.08351.6

SAT-based Automatic Test Pattern Generation

Authors: Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, and Daniel Tille

Published in: Dagstuhl Seminar Proceedings, Volume 8351, Evolutionary Test Generation (2009)

Abstract

Due to the rapidly growing size of integrated circuits, there is a need for new algorithms for Automatic Test Pattern Generation (ATPG). While classical algorithms reach their limit, there have been recent advances in algorithms to solve Boolean Satisfiability (SAT). Because Boolean SAT solvers are working on Conjunctive Normal Forms (CNF), the problem has to be transformed. During transformation, relevant information about the problem might get lost and therefore is not available in the solving process. In the following we briefly motivate the problem and provide the latest developments in the field. The technique was implemented and experimental results are presented. The approach was combined with the ATPG framework of NXP Semiconductors. Significant improvements in overall performance and robustness are demonstrated.

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Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, and Daniel Tille. SAT-based Automatic Test Pattern Generation. In Evolutionary Test Generation. Dagstuhl Seminar Proceedings, Volume 8351, pp. 1-2, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2009)

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@InProceedings{drechsler_et_al:DagSemProc.08351.6,
  author =	{Drechsler, Rolf and Eggersgl\"{u}{\ss}, Stephan and Fey, G\"{o}rschwin and Tille, Daniel},
  title =	{{SAT-based Automatic Test Pattern Generation}},
  booktitle =	{Evolutionary Test Generation},
  pages =	{1--2},
  series =	{Dagstuhl Seminar Proceedings (DagSemProc)},
  ISSN =	{1862-4405},
  year =	{2009},
  volume =	{8351},
  editor =	{Holger Schlingloff and Tanja E. J. Vos and Joachim Wegener},
  publisher =	{Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
  address =	{Dagstuhl, Germany},
  URL =		{https://drops.dagstuhl.de/entities/document/10.4230/DagSemProc.08351.6},
  URN =		{urn:nbn:de:0030-drops-20152},
  doi =		{10.4230/DagSemProc.08351.6},
  annote =	{Keywords: Circuit, ATPG, SAT, Boolean Satisfiability}
}

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Documents authored by Fey, Görschwin

Verifying Reliability (Dagstuhl Seminar 12341)

Abstract

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SAT-based Automatic Test Pattern Generation

Abstract

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