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Abstract

Cite as

Lirida Alves de Barros-Naviner, Jean-François Naviner, Denis Teixeira Franco, and Mai Correia de Vasconcelos. Methods and Metrics for Reliability Assessment. In Fault-Tolerant Distributed Algorithms on VLSI Chips. Dagstuhl Seminar Proceedings, Volume 8371, pp. 1-15, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2009)

@InProceedings{alvesdebarrosnaviner_et_al:DagSemProc.08371.5,
  author =	{Alves de Barros-Naviner, Lirida and Naviner, Jean-Fran\c{c}ois and Teixeira Franco, Denis and Correia de Vasconcelos, Mai},
  title =	{{Methods and Metrics for Reliability Assessment}},
  booktitle =	{Fault-Tolerant Distributed Algorithms on VLSI Chips},
  pages =	{1--15},
  series =	{Dagstuhl Seminar Proceedings (DagSemProc)},
  ISSN =	{1862-4405},
  year =	{2009},
  volume =	{8371},
  editor =	{Bernadette Charron-Bost and Shlomi Dolev and Jo Ebergen and Ulrich Schmid},
  publisher =	{Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
  address =	{Dagstuhl, Germany},
  URL =		{https://drops.dagstuhl.de/entities/document/10.4230/DagSemProc.08371.5},
  URN =		{urn:nbn:de:0030-drops-19252},
  doi =		{10.4230/DagSemProc.08371.5},
  annote =	{Keywords: Reliability, fault tolerance, combinational logic}
}