@InProceedings{dutta_et_al:LIPIcs.CCC.2021.11,
author = {Dutta, Pranjal and Dwivedi, Prateek and Saxena, Nitin},
title = {{Deterministic Identity Testing Paradigms for Bounded Top-Fanin Depth-4 Circuits}},
booktitle = {36th Computational Complexity Conference (CCC 2021)},
pages = {11:1--11:27},
series = {Leibniz International Proceedings in Informatics (LIPIcs)},
ISBN = {978-3-95977-193-1},
ISSN = {1868-8969},
year = {2021},
volume = {200},
editor = {Kabanets, Valentine},
publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
address = {Dagstuhl, Germany},
URL = {https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.CCC.2021.11},
URN = {urn:nbn:de:0030-drops-142857},
doi = {10.4230/LIPIcs.CCC.2021.11},
annote = {Keywords: Polynomial identity testing, hitting set, depth-4 circuits}
}