Published in: LIPIcs, Volume 362, 17th Innovations in Theoretical Computer Science Conference (ITCS 2026)
Jiatu Li and Mengdi Wu. Identity Testing for Circuits with Exponentiation Gates. In 17th Innovations in Theoretical Computer Science Conference (ITCS 2026). Leibniz International Proceedings in Informatics (LIPIcs), Volume 362, pp. 95:1-95:22, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2026)
@InProceedings{li_et_al:LIPIcs.ITCS.2026.95,
author = {Li, Jiatu and Wu, Mengdi},
title = {{Identity Testing for Circuits with Exponentiation Gates}},
booktitle = {17th Innovations in Theoretical Computer Science Conference (ITCS 2026)},
pages = {95:1--95:22},
series = {Leibniz International Proceedings in Informatics (LIPIcs)},
ISBN = {978-3-95977-410-9},
ISSN = {1868-8969},
year = {2026},
volume = {362},
editor = {Saraf, Shubhangi},
publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
address = {Dagstuhl, Germany},
URL = {https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.ITCS.2026.95},
URN = {urn:nbn:de:0030-drops-253821},
doi = {10.4230/LIPIcs.ITCS.2026.95},
annote = {Keywords: Polynomial Identity Testing, Exponential Polynomials}
}